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	<title>Comments for Design For Testability Blog</title>
	<link>http://freedft.info</link>
	<description>This blog discusses Design For Testability guidelines for JTAG/Boundary Scan</description>
	<pubDate>Mon, 06 Sep 2010 08:47:42 +0000</pubDate>
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		<title>Comment on JTAG / Boundary Scan infrastructure supporting system level applications by jford</title>
		<link>http://freedft.info/?p=8#comment-3</link>
		<author>jford</author>
		<pubDate>Mon, 16 Oct 2006 20:22:49 +0000</pubDate>
		<guid>http://freedft.info/?p=8#comment-3</guid>
		<description>Very informative blog!  Especially for me, because I specialize in device-level DFT for IC designs (see www.dftdigest.com).  I've never been exposed much to board test.  I'll keep my eye on for my own learning purposes, and link to it from my site!

John</description>
		<content:encoded><![CDATA[<p>Very informative blog!  Especially for me, because I specialize in device-level DFT for IC designs (see <a href="http://www.dftdigest.com" rel="nofollow">www.dftdigest.com</a>).  I&#8217;ve never been exposed much to board test.  I&#8217;ll keep my eye on for my own learning purposes, and link to it from my site!</p>
<p>John</p>
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